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on-Chip Esd Protection Design by Using Polysilicon Diodes in Cmos Process by
  • Ker, Ming-Dou
  • Chen, Tung-Sheng
  • Wang, Tai-Ho
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Evaluation of Mos Devices as Mechanical Stress Sensors by
  • Chen, Tung-Sheng
  • Huang, Yu-Ren
Source: IEEE Transactions on Components and Packaging Technologies
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Effects of Ir Electrodes on Barium Strontium Titanate Thin-Film Capacitors for High-Density Memory Application by
  • Chen, Tung-Sheng
  • Balu, Venkatasubramani
  • Lee, Jack C
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Efficient Noise Isolation Technique for Soc Application by
  • Chen, Tung-Sheng
  • Lee, Chih-Yuan Lee
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Efficient Noise Isolation Technique for Soc Application by
  • Chen, Tung-Sheng
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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