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Detecting Signal-Overshoots for Reliability Analysis in High-Speed System-on-Chips by
  • Nourani, Mehrdad
  • Attarha, Amir R
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Application of Fuzzy Logic in Resistive Fault Modeling and Simulation by
  • Nourani, Mehrdad
  • Lucas, Carol
Source: IEEE Transactions on Fuzzy Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
False Path Exclusion in Delay Analysis of Rtl Structures by
  • Nourani, Mehrdad
  • Papachristou, Christos A
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Multiple Clocking Scheme for low-Power Rtl Design. by
  • Papachristou, Christos A
  • Nourani, Mehrdad
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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