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4-Mb Mosfet-Selected /Spl Mu/Trench Phase-Change Memory Experimental Chip by
  • Bedeschi, Ferdinando
  • Bez, Roberto
  • Bonizzoni, Edoardo
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Low-Voltage Hot Electrons and Soft-Programming lifetime Prediction in Nonvolatile Memory Celis by
  • Ghetti, andrea
  • Selmi, Luca
  • Bez, Roberto
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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