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Transmission line Analysis of Accumulation Layer in Iegt by
  • Moon, Jin-Woo
  • Chung, Sang-Koo
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Analytical Expression for Current Gain of an Igbt by
  • Moo, Jin-Woo
  • Chung, Sang-Koo
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Modified Trench Mos Barrier Schottky Tmbs Rectifier by
  • Moon, Jin-Woo
  • Choi, Yearn-Ik
  • Chung, Sang-Koo
Source: International Transactions on Electrophysics and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Injuection Currents Analysis of Buffer Junction by
  • Chung, Sang-Koo
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Impurity Profile Effects of Buffer Layer on Pt-Igbt Characteristics by
  • Kim, Chung-Hee
  • Chung, Sang-Koo
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Design Curves of Breakdown Voltage At Field Plate Edge and Effect on Interface Charge by
  • Chung, Sang-Koo
  • Han, Seung-Youp
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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