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		Architecture, Design and Application of An Event -Based Test System by Rajsuman, Rochit Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Design and Test of Large Embedded Memories: An Overview by Rajsuman, Rochit Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Guest Editors' Introduction:New World of Large Embedded Memories by Rajsuman, Rochit Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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