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		Testing of Digital Systems by Jha, Niraj K [author] Gupta, Sandeep [author] Material type: Text Language: English Publication details: Cambridge : Cambridge University Press, c2003 Online access: Table of Contents Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.381548 JHA, ...
		Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits by Bushnell, Michael L [author] Agrawal, Vishwani D [author] Series: Frontiers in Electronic Testing Material type: Text Language: English Publication details: New York : Springer, c2000 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.395 BUS.
		Digital Integrated Circuits Design for Test Using Simulink and Stateflow by Perelroyzen, Evgeni [author] Material type: Text Language: English Publication details: Boca Raton : Taylor and Francis, c2007 Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.3815 PER.
		Digital Circuit Testing and Testability by Lala, Parag K [author] Material type: Text Language: English Publication details: San Diego : Academic Press, c1997 Online access: Table of Contents Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.3950287 LAL, ...

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