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Gaining Physical Insights from Degradation Data by
  • Doganaksoy, Necip
  • Hali, David B
Source: Journal of Quality Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Bayesian Model for Integrating Multiple Sources of lifetime Information in System-Reliability Assessments by
  • Reese, C.Shane
  • Wilson, Alyson G
Source: Journal of Quality Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Comparison of Maximum likelihood and Median-Rank Regression for Weibuli Estimation by
  • Genschel, Ulrike
Source: Quality Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Some Testimators for Scale Parameter and Reliability Function of Weibuli lifetime Data by
  • Al-Hemyari, Z.A
Source: Journal of Risk and Reliability: Proceedings OfI Mech E Part-O
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
The Effect of Model Uncertainty on Maintenance Optimization by
  • Bed for d, T
  • Bunea, Cornel
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
FittingWeibuli Log-linear Model to Accelerated life-Test Data by
  • Kececioglu, Dimitri
  • Wang, Wendai
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Pitfalis of Accelerated Testing by
  • Meeker, Wililam Q
  • Escobar, Luis A
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Maintenance-Policy Cost-Analysis for a Series System with Highly-Censored Data by
  • Pohl, E.A
  • Reineke, David M
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Failure-Time Model for Infant-Mortality and Wearout Failure Modes by
  • Meeker, Wililam Q
  • Chan, Victor
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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