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		A Sinewave Fitting Procedure for Characterizing Data Acquisition Channels InPresence of Time Dase Distoration and Time Jitter. by Pintelon, R Vandersteen, G Schoukens, J Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onUse of System Identification for Accurate Parametric Modeling of Nonlinear System Systems Using Noisy Measurements. by Vandersteen, G Rolain, Y Schoukens, J Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Model Selection Through A Statistical Analysis ofGlobal Minimum of A Weighted Nonlinear Least Squares Cost Function. by Vandersteen, G Pintelon, R Schoukens, J Source: Ieee Transactions on Signal Processing Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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