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Deterministic Built-In Test Pattern Generation for High-Performance Circuits Using Twisted-Ring Counters. by
  • Iyengar, V
  • Murray, B. T
  • Chakrabarty, K
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Huffman Encoding of Test Sets for Sequential Circuits. by
  • Murray, B. T
  • Lyengar, V
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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