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A Systematic Method for Modifying March Tests for Bit-Oriented Memories Into Tests for Word-Oriented Memories by
  • Goor, Ad J. Van De
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Static and Dynamic Behavior of Memory Cell Array Spot Defects in Embedded Drams by
  • Ars, Zaid Al
  • Goor, Ad J. Van De
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
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Efficient Tests for Realistic Faults in Dual-Port Srams by
  • Hamdioui, Said
  • Goor, Ad J. Van De
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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