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		Paraliel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories by Mazumder, P Patel, Janak K Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Physical Design tool for Built-In Self-Repairable Rams by Chakraborty, K Kulkarni, S Bhattacharya, M Mazumder, P Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Noise Margins of Threshold Logic Gates Containing Resonant Tunneling Diodes. by Mazumder, P Bhattacharaya, M Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing) Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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