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		Efficient Generation of Pre-Silicon Mos Model Parameters for Early Circuit Design by Orshansky, Michael An, Judy liu, Bili. Y Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Impact of Interfacial Layer and Transition Region on Gate Current Performance for High-K Gate Dielectric Stack Its Tradeoff with Gate Capacitance by Fan, Yang-Yu An, Judy Banerjee, Sanjay K Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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