Your search returned 2 results.

Sort
Results
Lower System Reliability Bounds from Binary Failure Data Using Bootstrapping by
  • Leemis, Lawrence M
Source: Journal of Quality Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Order Statistics in Goodness-Of-Fit Testing by
  • Glen, andrew
  • Leemis, Lawrence M
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Pages
Visit counter For Websites

Copyright © 
Engr Abul Kalam Library, NEDUET, 2024