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		A Unified Approach for Timing Verification and Delay Fault Testing by Sivaraman, Mukund [author] Strojwas, Andrzej J [author] Material type: Text Language: English Publication details: Boston : Kluwer Academic Publishers, c1998 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 003.8 SIV.
		Statistical Control of Vlsi Fabrication Processes by Mozumder, Purnendu K Strojwas, andrzej J Source: IEEE Transactions on Components Hybrids and Manufacturing Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Ic Manufacturing Diagnosis Based on Statistical Analysis Techniques by Kibarian, John K Strojwas, andrzej J Source: IEEE Transactions on Components Hybrids and Manufacturing Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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