Raahemifar, K Ahmadi, M <br/><br/>
Design- for -Testability Techniques  for  Detecting Delay Faults in Cmos/Bicomos  Logic Families. 

 - 1279-1290 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Concurrent Testing<br/>Delay Fault and Stuck Open Fault Testing