Hong, J. H Tsai, C. H Wu, C. W <br/><br/>
Hierarchical System Test By An Ieee 11490.5 Mtm-Bus Slave-Module Interface Core. 

 - 503-516 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Boundary Scan<br/>System-on-Chip