TY  - SER
AU  - Kuhn, H
AU  - Mnatsakanov, T. T
AU  - Schlogl, A. E
TI  - Temperature Dependent Characterization on Bipolar Silicon Power Semiconductors- A New Physical Model Validated By Device - Internal Probing Between 400-100k
KW  - Mobility
KW  - Physical Modeling
ER  -