Nicolici, N Al-Hashimi, B M <br/><br/>
Multiple Scan Chains  for  Power Minimization During Testing Application in Sequential Circuits 

 - 721-734 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scan-During-Sustaion(Sds)Method.<br/>Chain and Design Process<br/>Prototyping