Conti, M Crippa, P. Orcioni, S. <br/><br/>
Layout-Based Statistical Modeling  for Prediction ofMatching Properties of Mos Transistors 

 - 680-684 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mismatch<br/>Partitioned-Modeling<br/>Statistical Modeling