TY  - SER
AU  - Vainshtein, Sergey
AU  - Yuferev, Valentin
AU  - Kostamovaara, Juha
TI  - Nondestructive Current Localization Upon High-Current Nanosecond Switching of An Avalanche Transistor
KW  - Impact Ionization
KW  - Device Reliability
ER  -