Vainshtein, Sergey Yuferev, Valentin Kostamovaara, Juha <br/><br/>
Nondestructive Current Localization Upon High-Current Nanosecond Switching of An Avalanche Transistor 

 - 1988-1990 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Impact Ionization<br/>Device Reliability