Michelakis, Kostis Vilches, Antonio <br/><br/>
Average Drift Mobilty and Apparent Sheet-Electron Density Profiles in Strained-Si-Sige Buried-Channel Depletion-Mode N-Mosfets 

 - 1309-1314 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Drift Mobility<br/>Heterostructure<br/>Metal-Oxide Semiconductor