Nair, Deleep R Shukuri, S Mahapatra, S <br/><br/>
Cycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling 

 - 1672-1679 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Hot Carriers<br/>Device Scaling