Su, Stephen Y.H. liaw, Chi-Chang Malaiya, Yashwant K. <br/><br/>
Test-Experiments  for  Detection and Location of Intermittent Faults in Sequential Circuits 

 - 989-995 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Dynamic Programming<br/>Fault Detection<br/>Fault Diagnosis