Jaeger, Richard C. Johnson, R. Wayne <br/><br/>
Evaluation of Piezoresistive Coefficient Variation in Silicon Stress Sensors Using a Four-Point Bending Test Fixture 

 - 904-914 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bending Test<br/>Piezoresistance Coefficients<br/>Variation