Reddy, Sudhakar M. Saluja, K. K Karpovsky, Mark <br/><br/>
A Data Compression Technique  for  Built-In Self-Test 

 - 1151-1156 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bist<br/>Built-In Self-Test (Bist)<br/>Data Compression