Kolodzey, James Chen, Shong-Chin Olowolafe, Johnson Olufemi <br/><br/>
Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon 

 - 121-128 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Dielectric Breakdown<br/>Semiconductor Dbr<br/>Mos Capacitor