TY  - SER
AU  - Ang, D. S.
AU  - ling, C. H.
TI  - A Comparison of Hot-Carrier Degradation in Tungsten Polycide Gate and Poly Gate P-Mosfet'S
KW  - Gate-To-Drain Capacitance
KW  - Hot-Carrier Degradation
KW  - Tungsten Polycide
ER  -