Ang, D. S. ling, C. H. <br/><br/>
A Comparison of Hot-Carrier Degradation in Tungsten Polycide Gate and Poly Gate P-Mosfet'S 

 - 895-903 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Gate-To-Drain Capacitance<br/>Hot-Carrier Degradation<br/>Tungsten Polycide