Hess, K Kizilyalil, Lsik C. Lyding, Joseph W. <br/><br/>
Giant Isotope Effect in Hot Electron Degradation of Metal Oxide Silicon Devices 

 - 406-416 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Charge Carrier Processes<br/>Cmos Integrated Circuit<br/>Transistor Array