TY  - SER
AU  - Chyau, Chwan-GWO
AU  - Jang, Sheng-Lyang
TI  - A Compact Pre-and Post-Stress I-V Model  for  Submicrometer Buried-Channel Pmosfet'S
KW  - Bc Mosfet'S
KW  - Bidirectional Model
KW  - Hot-Carrier-Induced Degradation
ER  -