Chyau, Chwan-GWO Jang, Sheng-Lyang <br/><br/>
A Compact Pre-and Post-Stress I-V Model  for  Submicrometer Buried-Channel Pmosfet'S 

 - 2167-2178 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bc Mosfet'S<br/>Bidirectional Model<br/>Hot-Carrier-Induced Degradation