TY  - SER
AU  - Lui, O. K. B.
AU  - Tam, S. W. B.
AU  - Ohshima, H.
TI  - Investigation OfLow Field Leakage Current Mechanism in Polysilicon Tft'S
KW  - Degradation
KW  - Density-Of-States
KW  - Device Modeling
ER  -