Lui, O. K. B. Tam, S. W. B. Ohshima, H. <br/><br/>
Investigation OfLow Field Leakage Current Mechanism in Polysilicon Tft'S 

 - 213-217 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Degradation<br/>Density-Of-States<br/>Device Modeling