Ang, D. S. ling, C. H. <br/><br/>
U Nified Model  for Self-limiting Hot-Carrier Degradation in Ldd N-Mopdfet'S 

 - 149-159 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Color Image<br/>Gate-To-Drain Capacitance<br/>Meteor-Burst Communications