Chang, Kow-Ming li, ChII-Horng Yeh, T L <br/><br/>
The Relation Phenomena of Positive Charges Inthin Gate Oxide During Fowler-Nordheim Tunneling Stress 

 - 1684-1689 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Fowler-Nordheim Tunneling<br/>Gate Oxide<br/>Positive Charges