Chung, S.T. Yang, Jiuun-Jer <br/><br/>
A New Approach  for  Characterizing Structure-Dependent Hot-Carrier Effects in Drain-Engineered Mosfet'S 

 - 1371-1377 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Approach<br/>Mosfet<br/>Structure-Properties