TY  - SER
AU  - Renn, Shing-Hwa
AU  - Raynaud, Christing
AU  - Balestra, Francis
TI  - A Thorough Investigation OfDegradation Induced by Hot-Carrier Injection in Deep Submicron N-and P-Channel Partialiy and Fuliy Depleted
KW  - Device lifetime
KW  - Hot-Carrier Effect
KW  - Soi Mosfet
ER  -