Ito, K Kato, K Hirano, Naohiko <br/><br/>
Experimental Characterization of Simultaneous Switching Noise  for  Multichip Modules 

 - 609-613 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Multichip Module<br/>Mcm<br/>Simultaneous Update