Cheng, Zhi-Uuan ling, C. H. <br/><br/>
A Steady Stated Drain Current Technique  for  Generation and Recombinaton lifetime Measurement InSoi Mosfet 

 - 97-102 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Carrier Generation lifetime<br/>Fuliy-Depleted Soi Mosfet<br/>Recombination lifetime