Kumar, M Jagadesh Verma, Vikram <br/><br/>
Elimination of Bipolar Induced Drain Breakdown and Single Transistor Latch in Submicron Pd Soi Mosfet 

 - 367-370 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Floating Body Effects<br/>Soi Mosfet<br/>Cmos Reliability