Kim, Yougduk Park, Sekwang <br/><br/>
Analysis OfInfluence OfAddress Electrode Width on High-Speed Addressing UsingVt Close Curve and Dynamic V Data Margin 

 - 183-190 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Address Discharge<br/>Plasma Display Panel<br/>Vt Close Curve