Olilges, Sven <br/><br/>
In Situ Observation of Cracks in Gold Nano-Interconnects on Flexible Substrates 

 - 175-178 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning Electron Microscopy<br/>Nanocrystalilne<br/>Multilayer Thin Films