Yamashita, Jun Yotsuyanagi, Hiroyuki Hashizume, Masaki <br/><br/>
Sat-Based Test Generation  for  Open Faults Using Fault Excitation Caused by Effect of Adjacent lines 

 - 2561-2567 p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Open Faults<br/>Adjacent lines<br/>Test Pattern Generation