Strausser, Yale <br/><br/>
Characterization in Silicon Processing  

 - Boston :   Butterworth-Heinemann,   c1993 
 - XIII, 240 p. 
 - Materials Characterization Series .
<br/><br/>
<br/><br/><label>ISBN: </label>0750691727 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electric Conductors<br/>Semiconductor Films<br/>Silicon
<br/><br/><label>Dewey Class. No.: </label>620.193  / STR