TY  - BOOK
AU  - Lala, Parag K.
TI  - Digital Circuit Testing and Testability 
SN  - 0124343309
U1  - 621.3950287 
PY  - 1997///
CY  - San Diego : 
PB  - Academic Press, 
KW  - Digital Integrated Circuits Testing
KW  - Integrated Circuits Very Large Scale Integration Testing
N1  - YY
UR  - https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-12-434330-9.pdf
ER  -