Bardell, Paul H. <br/><br/>
Built in Test for VLSI Pseudorandom Techniques  

 - New York :   John Wiley,   c1987 
 - XIII, 354 p.  : ill 
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>0471624632 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated Circuits Very Large Scale Integration Testing
<br/><br/><label>Dewey Class. No.: </label>621.395  / BAR