Miczo, Alexander <br/><br/>
Digital Logic Testing and Simulation  

 - New York :   John Wiley,   c1987 
 - XIV, 414 p.  : ill 
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>047161307X 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital Electronics Testing
<br/><br/><label>Dewey Class. No.: </label>621.381548  / MIC