TY  - BOOK
AU  - Bushnell, Michael L.
AU  - Agrawal, Vishwani D.
TI  - Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits 
SN  - 0792379918
U1  - 621.395 
PY  - 2000///
CY  - New York : 
PB  - Springer, 
KW  - Digital Integrated Circuits Testing
KW  - Integrated Circuits Very Large Scale Integration Testing
KW  - Mixed Signal Circuits Testing
N1  - YY
UR  - https://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-7923-7991-8.pdf
ER  -