Bushnell, Michael L. <br/><br/>
Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits  

 - New York :   Springer,   c2000 
 - XVIII, 690 p.  : ill 
 - Frontiers in Electronic Testing .
<br/><br/>Includes Bibliographical References and Index 
<br/><br/><label>ISBN: </label>0792379918 
<br/><br/><label>ISSN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital Integrated Circuits Testing<br/>Integrated Circuits Very Large Scale Integration Testing<br/>Mixed Signal Circuits Testing
<br/><br/><label>Dewey Class. No.: </label>621.395  / BUS